PURPOSE:
For the modernization of X-ray spectral devices with high dispersion, when solving industrial and scientific problems, to create a new generation of scientific equipment, in particular, for X-ray microscopy, plasma visualization, astrophysics, etc.
DESCRIPTION:
Multilayer X-ray mirrors are artificially created multilayer film compositions in which a periodic alternation of layers of two materials is provided in one direction. The thickness of individual layers of such materials ranges from ~ 0.7 to 20 nm. The thickness of the entire film composition can reach ~ 0.3 – 1 µm. The choice of materials for creating mirrors is determined by the ratio of their optical constants in a given wavelength range. Mirrors have a reflection coefficient of up to 70% at the operating wavelength, have high time and thermal stability, and can be applied to flat and curved substrates.
ADVANTAGES:
In terms of their optical properties, multilayer X-ray mirrors correspond to the world level.
RECOMMENDED FIELD OF APPLICATION:
In X-ray spectral analysis (primarily for monitoring light chemical elements – from Be to CI), in astrophysics to obtain information from extraterrestrial sources of X-ray radiation, primarily the Sun, in medicine and biology, in micro- and nanoelectronics with the advancement of projection X-ray lithography in the short-wavelength part of the spectrum (~ 6.7 nm), in experiments on plasma diagnostics, as well as when equipping synchrotrons and other X-ray sources.
RESULTS OF THE RESEARCH:
Provides consistent results.
STAGE OF THE DEVELOPMENT READINESS:
Tested in trial operation.
TRANSFER OPPORTUNITY:
Collaborative industrialization.
NOVELTY:
6 patents of Ukraine.
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